Key features:

VISION is a unique comprehensive modeling platform that makes system simulation reliable enough to replace costly measurement tasks of large system architectures.

Vision offers a comprehensive methodology to extract a complete and accurate model that takes into account all observed phenomenas.

  • Turn-key circuit and system level modeling environment.
  • Measurement Benches control for model extraction and validation.
  • Device modeler toolbox for active and passive circuits (LNAs, HPAs, Filters, Mixers…)
  • System Level Macro-Modeling solutions and direct export functionalities to main commercial system simulators.

VISION Modules

VISION Visualization

VISION Visualization tool offers an intuitive environment to easily compare measurement and simulation results. The workbook will save your visualization profile as a project, with preloaded files and customized displays.

VIS100A1
Visualization

VIS100A1 is a standard visualization tool. It allows the display of basic measurements like: AMAM, AMPM, Gain, PAE, ACPR ... Data can be generated from different modules like Device Modeler and System Modeler. Available visualization formats are predetermined according to either, the Figures Of Merits needed for the models or the overall RF chain results within the System Modeler. Other available features are:

  • Measurement analysis display
  • Multiple results
  • Multiple data format :Waveform, Spectrum, Probes
  • Post Processing functions and dataset management
  • Tabs-based graphical sections
VIS100A2
Advanced Visualization

VIS100A2 is an Advanced Visualization tool that allows viewing measurements and/or simulations results in a user-defined format. Advanced visualization formats can be saved in different workbooks which can contain several specialized graphics.

Customized Figure Of Merits can be created using the Equation Editor within this module. This tool enables seeking and displaying directly and quickly useful information among a large quantity of available data. Equation editor allows the user to generate algebraic equation of standard mathematical operators and fuctions referencing data available in the measurement file.

VISION Bench Control

VISION BENCH CONTROL enables an easy measurement bench control compatible with standard instrumentation to extract different types of behavioral models. It offers an intuitive measurement interface to qualify these models under various test conditions.

VIS100B1
Extraction Setup

VIS100B1 is a test bench control module. Extraction setup uses a vector signal generator and 4 vector receivers of a VNA to measure a and b-waves at DUT reference plane. Generated Data will be later used in device modeler to extract the behavioral model of the circuit under test. This tool offers an intuitive user interface for advanced bench control and measurement automation.

  • Simple setup & calibration procedure for multiple model’s type extraction
  • Re-use of instruments and components already available in the Lab.
  • 1-Tone measurements for in-band frequency memory effect
  • 3-Tone measurements for High & Low frequency effects
  • Load Pull tuner control for bilateral models
  • Fully automated measurement bench
VIS100B2
Validation Setup

VIS100B2 is a bench control module dedicated to model validation. The Validation setup uses a signal generator and a spectrum analyzer to measure the DUT response when excited with different stimulus (CW, Pulsed, Modulated…). This data is then compared to the data obtained from the model simulation and allows a refinement and validation of the extracted model.

  • Circuit and system validation measurement using standard hardware
  • ACP; IMD; Pulsed; 50Ω & Load Pull
  • Validation on multiple signals: 2-Tones; Pulsed; LTE; 256 QAM; File based
  • Feedback to circuit and system modeler for model tuning
  • Possibility to optimize circuit models based on system measurement results
VIS100B3
Sweep-plan

The VIS100B3 “Sweep-Plan” tool offers a user-friendly control interface to automatically sequence different measurements according to the parameters defined by the user (bias voltages, load impedances, RF frequencies, tone-spacing, T° control).

The sequence can be built through simple drag and drop actions in the sweep plan windows.

Selecting and unselecting the check boxes allows to quickly re-use a corporate sweep plan menu, and update the given measurement sequence depending on the characterization need.

Selecting each branch of the sweep plan activate a configuration windows from which each setting can be updated.

The sequencing process greatly reduces total measurement time and insures a standard methodology in the model extraction and validation. 

VISION Device Modeler

VISION DEVICE MODELER enables accurate behavioral model extractions for different RF and Microwave circuits, with minimum level of complexity for maximum system simulation efficiency !

VIS100C
Device Modeler

VIS100C is a Device Modeler tool. After generating measurement data on the DUT, this module will extract a model that fit the circuit response with respect to the behavior observed. Depending on this DUT’s behavior, the modeling wizard drives the user to a well-balanced solution, where the fit versus frequency and power is optimized while lowering the model complexity to ensure a good simulation-speed and convergence.

Thanks to a basic simulation, the model is then qualified through a “Test Plan” with other test signals, not used during the extraction work. These independent test signals are provided to check the physical behavior and the robustness of the model. As a function of the circuit behavior and simulation need, different models can be proposed. The following table presents some possible combinations.

Device Modeler:

  Nonlinear Mismatch effect In-band Memory Low Freq. Memory NF (noise)
Limiters ✓ N.A ✓ N.A N.A
Mixers ✓ N.Av ✓ N.A ✓
Passive N.A ✓ ✓ N.A ✓
Multi Function Chips N.A ✓ ✓ N.A N.A
LNA-B-SP N.A ✓ ✓ N.A ✓
HPA-U-HF ✓ N.A ✓ N.A N.A

N.A : Non applicable, N.Av: Non available

VIS100D
Advanced Device Modeler

Using the VIS100D Module, the device modeler VIS100C can be completed with an advanced library of more complex models. More phenomena can be monitored and modeled .

Refer the the following table for the advanced device modeler capabilities

Advanced Device Modeler:

  Nonlinear Mismatch Effect In-band Memory Low Freq. Memory NF (noise)
LNA-B-HF ✓ ✓ ✓ N.Av ✓
HPA-B-HF ✓ ✓ ✓ N.Av N.A
HPA-U-HFLF ✓ N.Av ✓ ✓ N.A
HPA-B-HFT° ✓ ✓ ✓ T° N.A

NA: Non Applicable, N.Av: Non Available

VISION System Modeler

VISION SYSTEM MODELER enables model concatenation , RF front-end system modeling, transient simulations and facilitates system simulation for large scale architectures such as active antennas or 5G communication systems.

VIS100E
System Modeler

VS100E is a System Modeling tool. Elementary circuit models extracted with the device modeler can be used in the system schematic editor. This schematic can be used to connect different circuits together, to create a system sub-assembly, such as for RF transceiver, down or up conversion designs. Different sources (Pulse, 2-tone, AWG, ..) and probes (Pmeter, ACPR, NF,..) can be connected the RF sub-assembly to evaluate the overall performances.

Robust and fast transient simulation with modulated signals can be performed to observe the response of the sub-assembly with complex stimuli. This module includes transient simulation control, parameters sweep, statistical analysis, noise calculation.When the sub-system specifications are in line with the designer expectations, it is then possible to create a unique Macro-Model of the sub-assembly thanks to models concatenation. This will simplify and strengthen the simulation or larger systems were a huge number of RF circuits are assembled.

Behavioral modeling flow for accurate RF and microwave system simulation - 2017 IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems

Wideband test bench dedicated to behavioral modeling of nonlinear RF blocks with frequency transposition and memory.- 91st ARFTG Microwave Measurement Conference (ARFTG) 2018

VISION Macro-Link

VISION MACRO LINK enables sub-system model export to external system simulators. The VISION model includes an internal equation solver to leverage its simulation capabilities in external simulators and avoid time-consuming circuit-system co-simulation processes.

VIS100F
Macro-Link

VIS100F is the “Macro-Link” option that allows exporting Netlist files associated to the macro-model, this one contains predetermined number of export templates to external system environments such as VSS (NI), System Vue (Keysight), MatLab Simulink. The macro-model embeds its transient simulation solver, so that even if the system simulator which is targeted cannot handle some phenomena, such as bilateral effects in data-flow mode, or frequency transposition without circuit co-simulation, the simulation results will stay accurate, and without compromise.

This step represents the last step in the system integration and analysis. One can export all or part of the system modeled.

VISION Visualization tool offers an intuitive environment to easily compare measurement and simulation results. The workbook will save your visualization profile as a project, with preloaded files and customized displays.

VIS100A1
Visualization

VIS100A1 is a standard visualization tool. It allows the display of basic measurements like: AMAM, AMPM, Gain, PAE, ACPR ... Data can be generated from different modules like Device Modeler and System Modeler. Available visualization formats are predetermined according to either, the Figures Of Merits needed for the models or the overall RF chain results within the System Modeler. Other available features are:

  • Measurement analysis display
  • Multiple results
  • Multiple data format :Waveform, Spectrum, Probes
  • Post Processing functions and dataset management
  • Tabs-based graphical sections
VIS100A2
Advanced Visualization

VIS100A2 is an Advanced Visualization tool that allows viewing measurements and/or simulations results in a user-defined format. Advanced visualization formats can be saved in different workbooks which can contain several specialized graphics.

Customized Figure Of Merits can be created using the Equation Editor within this module. This tool enables seeking and displaying directly and quickly useful information among a large quantity of available data. Equation editor allows the user to generate algebraic equation of standard mathematical operators and fuctions referencing data available in the measurement file.

VISION BENCH CONTROL enables an easy measurement bench control compatible with standard instrumentation to extract different types of behavioral models. It offers an intuitive measurement interface to qualify these models under various test conditions.

VIS100B1
Extraction Setup

VIS100B1 is a test bench control module. Extraction setup uses a vector signal generator and 4 vector receivers of a VNA to measure a and b-waves at DUT reference plane. Generated Data will be later used in device modeler to extract the behavioral model of the circuit under test. This tool offers an intuitive user interface for advanced bench control and measurement automation.

  • Simple setup & calibration procedure for multiple model’s type extraction
  • Re-use of instruments and components already available in the Lab.
  • 1-Tone measurements for in-band frequency memory effect
  • 3-Tone measurements for High & Low frequency effects
  • Load Pull tuner control for bilateral models
  • Fully automated measurement bench
VIS100B2
Validation Setup

VIS100B2 is a bench control module dedicated to model validation. The Validation setup uses a signal generator and a spectrum analyzer to measure the DUT response when excited with different stimulus (CW, Pulsed, Modulated…). This data is then compared to the data obtained from the model simulation and allows a refinement and validation of the extracted model.

  • Circuit and system validation measurement using standard hardware
  • ACP; IMD; Pulsed; 50Ω & Load Pull
  • Validation on multiple signals: 2-Tones; Pulsed; LTE; 256 QAM; File based
  • Feedback to circuit and system modeler for model tuning
  • Possibility to optimize circuit models based on system measurement results
VIS100B3
Sweep-plan

The VIS100B3 “Sweep-Plan” tool offers a user-friendly control interface to automatically sequence different measurements according to the parameters defined by the user (bias voltages, load impedances, RF frequencies, tone-spacing, T° control).

The sequence can be built through simple drag and drop actions in the sweep plan windows.

Selecting and unselecting the check boxes allows to quickly re-use a corporate sweep plan menu, and update the given measurement sequence depending on the characterization need.

Selecting each branch of the sweep plan activate a configuration windows from which each setting can be updated.

The sequencing process greatly reduces total measurement time and insures a standard methodology in the model extraction and validation. 

VISION DEVICE MODELER enables accurate behavioral model extractions for different RF and Microwave circuits, with minimum level of complexity for maximum system simulation efficiency !

VIS100C
Device Modeler

VIS100C is a Device Modeler tool. After generating measurement data on the DUT, this module will extract a model that fit the circuit response with respect to the behavior observed. Depending on this DUT’s behavior, the modeling wizard drives the user to a well-balanced solution, where the fit versus frequency and power is optimized while lowering the model complexity to ensure a good simulation-speed and convergence.

Thanks to a basic simulation, the model is then qualified through a “Test Plan” with other test signals, not used during the extraction work. These independent test signals are provided to check the physical behavior and the robustness of the model. As a function of the circuit behavior and simulation need, different models can be proposed. The following table presents some possible combinations.

Device Modeler:

  Nonlinear Mismatch effect In-band Memory Low Freq. Memory NF (noise)
Limiters ✓ N.A ✓ N.A N.A
Mixers ✓ N.Av ✓ N.A ✓
Passive N.A ✓ ✓ N.A ✓
Multi Function Chips N.A ✓ ✓ N.A N.A
LNA-B-SP N.A ✓ ✓ N.A ✓
HPA-U-HF ✓ N.A ✓ N.A N.A

N.A : Non applicable, N.Av: Non available

VIS100D
Advanced Device Modeler

Using the VIS100D Module, the device modeler VIS100C can be completed with an advanced library of more complex models. More phenomena can be monitored and modeled .

Refer the the following table for the advanced device modeler capabilities

Advanced Device Modeler:

  Nonlinear Mismatch Effect In-band Memory Low Freq. Memory NF (noise)
LNA-B-HF ✓ ✓ ✓ N.Av ✓
HPA-B-HF ✓ ✓ ✓ N.Av N.A
HPA-U-HFLF ✓ N.Av ✓ ✓ N.A
HPA-B-HFT° ✓ ✓ ✓ T° N.A

NA: Non Applicable, N.Av: Non Available

VISION SYSTEM MODELER enables model concatenation , RF front-end system modeling, transient simulations and facilitates system simulation for large scale architectures such as active antennas or 5G communication systems.

VIS100E
System Modeler

VS100E is a System Modeling tool. Elementary circuit models extracted with the device modeler can be used in the system schematic editor. This schematic can be used to connect different circuits together, to create a system sub-assembly, such as for RF transceiver, down or up conversion designs. Different sources (Pulse, 2-tone, AWG, ..) and probes (Pmeter, ACPR, NF,..) can be connected the RF sub-assembly to evaluate the overall performances.

Robust and fast transient simulation with modulated signals can be performed to observe the response of the sub-assembly with complex stimuli. This module includes transient simulation control, parameters sweep, statistical analysis, noise calculation.When the sub-system specifications are in line with the designer expectations, it is then possible to create a unique Macro-Model of the sub-assembly thanks to models concatenation. This will simplify and strengthen the simulation or larger systems were a huge number of RF circuits are assembled.

Behavioral modeling flow for accurate RF and microwave system simulation - 2017 IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems

Wideband test bench dedicated to behavioral modeling of nonlinear RF blocks with frequency transposition and memory.- 91st ARFTG Microwave Measurement Conference (ARFTG) 2018

VISION MACRO LINK enables sub-system model export to external system simulators. The VISION model includes an internal equation solver to leverage its simulation capabilities in external simulators and avoid time-consuming circuit-system co-simulation processes.

VIS100F
Macro-Link

VIS100F is the “Macro-Link” option that allows exporting Netlist files associated to the macro-model, this one contains predetermined number of export templates to external system environments such as VSS (NI), System Vue (Keysight), MatLab Simulink. The macro-model embeds its transient simulation solver, so that even if the system simulator which is targeted cannot handle some phenomena, such as bilateral effects in data-flow mode, or frequency transposition without circuit co-simulation, the simulation results will stay accurate, and without compromise.

This step represents the last step in the system integration and analysis. One can export all or part of the system modeled.

Videos

PA behavioral model extraction and system simulation

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